Testing microwave devices under different source impedance values-a novel technique for on-line measurement of source and device reflection coefficients

This paper describes a new approach for fast and accurate determination of the source reflection coefficient in microwave source-pull measurements. To the authors' knowledge, this is the only technique that allows the simultaneous measurement of the source and the device-under-test input reflection coefficients. A traditional vector network analyzer is used as a four-channel receiver. The calibration procedure is based on a new reflectometer model that extends the traditional error box concept. Experimental results are presented and compared to data obtained with traditional techniques.